Automatic BSIM3/4 Model Parameter Extraction with Penalty Function
摘要
The BSIM3/4 compact models have been widely used in the microelectronic industry over the past decade. As the technology scale down achieved the 0.09µ limit, the complexity of the compact models and their parameter extraction has increased incredibly. It has been clearly recognized that the automated parameter extraction methodology can be beneficial for both semiconductor foundries and IC design houses. In this work we report the first successful automatic extraction of BSIM3/4 model parameters based on the numerical optimization of a function, which includes penalty functions. The reported algorithm is an extension of ISE simulator ISExtract [1].
引用本文（GB/T 7714）
Y. Mahotin, E. Lyumkis. Automatic BSIM3/4 Model Parameter Extraction with Penalty Function[J]. 未知来源, 2004.
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