Bayesian Approach for Optimum Step-Stress Accelerated Life Testing

2007中國統計學報Mathematics被引 5

摘要

This paper presents optimum plans for simple step-stress tests from a Bayes viewpoint. We obtain the optimum test plans to minimize the asymptotic variance of the maximum likelihood estimator of the mean life at a design (use) stress. The emphasis of this paper is to establishment of new areas of application to step-stress accelerated life testing (ALT) and an improvement of existing procedures and theories. Examples for Type Ⅰ and Type Ⅱ censored cases are illustrated. The numerical results indicate that under the same conditions, the proposed Bayesian approach is superior to that of Bai (1989) in the sense that the asymptotic variance is smaller.

引用本文（GB/T 7714）

Lii-Yuh Leu, Kuan-Fu Shen. Bayesian Approach for Optimum Step-Stress Accelerated Life Testing[J]. 中國統計學報, 2007.

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DOI：https://doi.org/10.29973/jcsa.200707.0001

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