Backlit Keyboard Inspection Using Machine Vision
摘要
A robust system for backlit keyboard inspection is revealed. The backlit keyboard not only has changeable diverse colors but also has the laser marking keys. The keys on the keyboard can be divided into regions of function keys, normal keys, and number keys. However, there might have some types of defects: incorrect illuminating area, non-uniform illumination of specified inspection region(IR), and incorrect luminance and intensity of individual key. Since the illumination features of backlit keyboard are too complex to inspect for human inspector in the production line, an auto-mated inspection system for the backlit keyboard is proposed in this paper. The system was designed into the operation module and inspection module. A set of image processing methods were developed for these defects inspection. Some experimental results demonstrate the robustness and effectiveness of the proposed system.